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FISCHERSCOPE® HM 2000

FISCHERSCOPE® HM 2000
FISCHERSCOPE® HM 2000
FISCHERSCOPE® HM 2000
FISCHERSCOPE® HM 2000
FISCHERSCOPE® HM 2000

The FISCHERSCOPE® HM2000 determines properties such as the indentation hardness and the depth-dependent elastic modulus – and all of that in the nanometer range!

If you want to measure a sample in multiple places or do automated testing, the FISCHERSCOPE HM2000 is ideal. In just a few clicks, you can program in the measuring points  – the instrument takes care of the rest.

In addition to quality testing in electroplating, a common area of application for the FISCHERSCOPE HM2000 is polymers' characterization at different temperatures. For this purpose, the automated system can be equipped with a heating stage.

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Applications Anodic Layer Testing, Nanoindentation & Scratch Test Instruments
Industries Aerospace, Commercial Services, Defence & Security, Manufacturing, Oil & Gas
  • Determination of the material parameters according to DIN EN ISO 14577 and ASTM E 2546
  • Dynamic mode for determining viscoelastic material properties (dynamic mechanical analysis)
  • Fast measurement: the zero points is determined within 30 seconds
  • Only minimal sample preparation required, even on dark surfaces
  • Suitable for testing solid materials and coatings > 1 µm thick, test-force range 0.1 – 2000 mN 
  • Thermally stable and resistant to vibrations: measures for several hours without external influences
  • Programmable sample stage for automated testing of multiple measurement points
  • Microscope with magnification levels from 4x to 40x for exact positioning of the measuring spot
  • The modular design enables customer-specific configurations or future upgrades of the device
  • Indenters: Vickers, Berkovich, carbide ball, Knoop, or customized indenters
  • Powerful WIN-HCU software for intuitive operation and evaluation.
FISCHERSCOPE® HM 2000

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