The game-changing advancements in the EDAX Octane Elite energy dispersive x-ray spectroscopy (EDS/EDX) system with Octane Elite silicon drift detectors (SDDs) take EDS analysis to the next level. This system includes detectors with a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use high-speed x-ray data processing technology within a smaller and fully vacuum-encapsulated detector device.
1. The mechanical properties of Si3N4 allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low-voltage analysis.
2. Fast pulse processing from mapping and quantification
3. Optimized data quality at all count rates
4. High-resolution quantitative analysis at mapping speeds greater than 400,000 output cps
5. EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.
6. The material properties and durability of Si3N4 ensure the most robust and reliable detectors available for all EDS applications.
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