The EDAX Velocity™ EBSD camera series offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials. Powered by a CMOS sensor, the Velocity combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.
1. Data collection rates up to 6,700 ipps: Collects EBSD maps in minutes for efficient scanning electron microscope (SEM) use, in-situ experiments, and 3D EBSD applications
2. High-speed, low-noise CMOS sensor: Provides high sensitivity, low noise images for EBSD indexing at the highest speeds
3. Orientation precision of less than 0.1°: Clear characterization of deformed microstructures with standard indexing routines
4. High indexing success rates: EDAX’s proven Triplet Indexing and patented Confidence Index provide unparalleled indexing performance on challenging real-world samples
5. High-speed simultaneous EDS-EBSD collection
The Velocity EBSD cameras have been optimized with compatible EDAX EDS detectors for efficient data collection at the highest speeds
No Videos uploaded for this product.
