The WITec Atomic Force Microscope (AFM) module integrated with a research-grade optical microscope provides superior optical access, easy cantilever tip alignment, and high-resolution sample survey. The WITec AFM objective provides a direct view of both sample and cantilever for straightforward and precise AFM tip positioning. All WITec Atomic Force Microscopes are designed to combine other imaging techniques such as Raman spectroscopy, Scanning Near-field Optical microscopy (SNOM), and luminescence microscopy polarization analysis, and light-field/dark-field illumination. The user can change between imaging methods by simply rotating the (optionally motorized) objective turret.
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