The Lightning In Situ TEM Heating and Biasing Solution allows to observe real-time dynamics of your specimen under a controllable electrical and thermal environment while maintaining optimal TEM performance. The state-of-the-art Nano-Chip features a 4-point-probe method to accurately control biasing and heating and retrieve meaningful data. Its design sustains the highest reachable electrical fields and temperatures, either individually or simultaneously.
1. High success rate
2. Best quality FIB lamellae
3. Heating & biasing accuracy: 4-point probe heating & biasing provides the most accurate temperature, voltage and current control.
4. Wide in situ stimuli range
5. Reliable temperature.
6. High Stability
7. Unaffected S/TEM performance
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