WITec´s award-winning TrueSurface Microscopy allows confocal Raman imaging along heavily inclined or very rough samples with the surface held in constant focus while maintaining the highest confocality. It is thereby possible to perform confocal imaging measurements parallel with and guided by a large area topographic scan.
The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry. It is directly installed at the microscope turret, which facilitates user-friendly and convenient handling.
WITec’s patented TrueSurface Microscopy option enables confocal Raman imaging, guided by surface topography. Topographic Raman Imaging, a technique pioneered by WITec, uses an advanced optical profilometer integrated within the instrument to provide one-pass simultaneous operation.