The new OmniScan X3 64 flaw detector addresses the increasing demand for 64-pulser PA and TFM in a portable format. Leveraging the use of dual array probes for austenitic/CRA/dissimilar welds, the OmniScan X3 64 instrument solves challenging PA and TFM applications, including thick-walled and austenitic welds and high-temperature hydrogen attack (HTHA). Sigma Enterprises is the authorized distributor for Olympus in the United Arab Emirates.
Power You Can Carry
Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications.
Benefit from 64-Pulser Phased Array
Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point.Slide Right: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law. Slide Left: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster.
Access Full 128-Element Aperture TFM
Made possible by new generation electronics, TFM imaging offers better focusing capabilities for smaller indications and an improved signal-to-noise ratio (SNR). With its 128-element aperture capacity, the OmniScan X3 64 model provides enhanced image clarity.Slide Right: This TFM image was acquired with 64 elements of a 128-element probe (3.5L128-I4 model) using an OmniScan X3 32-channel model.Slide Left: Here, the OmniScan X3 64 flaw detector enabled us to use the full 128-element aperture of our 3.5 MHz, 128-element I4 probe. Note the improved resolution and reduced background noise.
Confidence You Can See
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.
Confirm Your TFM Beam Coverage in Advance
The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector.
The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.
Up to Four TFM Modes Facilitate Flaw Interpretation and Sizing
Using different TFM modes (wave sets) in the same inspection increases your chances to detect irregularly oriented indications. The OmniScan X3 flaw detector provides up to four simultaneous TFM modes to generate images from different angles. The response and characteristics from each mode—such as the tip diffraction, corner trap, and defect profile—can be used simultaneously to confirm the flaw type and improve the sizing capabilities.